0 results for "9012909090"
WAFERS\PROBES OF CUSTOM FABRICATED CONTACT\NON CONTACT MODE SILICON FOR USE IN SCANNING PROBES MICROSCOPES (SPMS).THE PROBE SCANS A SPECIMEN AND FORMS AN IMAGE ON A SURFACE. IT CREATES THE SCAN UNDER VERY HIGH RESOLUTION USING THE MICROSCOPE.
CONTROLLERS FOR SCANNING PROBE MICROSCOPES (SPM) ARE AN INTEGRAL PART OF THE SYSTEM THAT CONTROL THE FUNCTION OF THE SPM ITSELF AND CONVERT INFORMATION FROM THE SCANS TAKEN INTO DIGITAL READINGS.
WAFERS\PROBES OF CUSTOM FABRICATED CONTACT\NON CONTACT MODE SILICON FOR USE IN SCANNING PROBES MICROSCOPES (SPMS). THE PROBE SCANS A SPECIMEN AND FORMS AN IMAGE ON A SURFACE. IT CREATES THE SCAN UNDER VERY HIGH RESOLUTION USING THE MICROSCOPE.
THE PRODUCT IS KNOWN AS AN IMAGER. IT CAPTURES X-RAY DATA AND CONVERTS IT INTO A DIGITAL IMAGE. THE GOODS ARE USED FOR MEDICAL, SURGICAL OR DENTAL APPLIANCES.
X-RAY HIGH VOLTAGE POWER SUPPLY, DC OUTPUT RANGE VOLTAGE 0 TO +/- 225KV, OUTPUT POWER 4.5KW, FEATURES INCLUDE ACTIVE POWER FACTOR CORRECTION, REMOTE INTERFACE ANALOGUE, UBS, ETHERNET AND RS-232.
TARIC Nomenclature
25 000+ codes
Classification Guide
1 095 HS4
BTI
1 000 000+ BTI