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HIGH PERFORMANCE FIELD PROGRAMMABLE GATE ARRAY (FPGA) BOARD USED IN THE ELECTRICAL TESTING OF SEMICONDUCTOR DEVICES. THE FPGA BOARD CAN ACCOMMODATE UP TO 18 MILLION APPLICATION SPECIFIC INTEGRATED CIRCUIT GATES, CUSTOMISED FOR THE SPECIFIC USE OF ELECTRICAL MEASURING AND CHECKING OF SEMICONDUCTOR DEVICES PRIOR TO MANUFACTURING. THE PRODUCT INCORPORATES FULL SYSTEM INTEGRATION AND TESTING OF ALL HARDWARE AND SOFTWARE AND ALSO ENABLES EARLY IDENTIFICATION AND ELIMINATION OF HARDWARE AND SOFTWARE BUGS AHEAD OF SILICON AVAILABILITY.

THIS IS A PORTABLE METER USED IN RESEARCHING SEMICONDUCTOR MATERIALS. THE UNIT CAN BE BATTERY OPERATED OR OPERATED FROM THE MAINS ELECTRICITY SUPPLY USING THE SUPPLIED 9 VOLT ADAPTER. IT SUPPLIES ONE OF THE 6 FIXED CONSTANT CURRENTS AND HAS A DIGITAL VOLTAGE DISPLAY. USED IN CONJUNCTION WITH A FOUR POINT PROBE THE READINGS CAN BE USED TO DETERMINE THE RESISTIVITY OF THE TEST SAMPLE. THE UBIT CAN BE OPERATED AS A STAND ALONE UNIT WITH A FACILITY TO STORE READINGS MADE OR BY USING THE SUPPLIED SOFTWARE IT CAN BE OPERATED VIA A PC. STORED READINGS CAN BE DOWNLOADED TO THE PC VIA THE SUPPLIED SOFTWARE. THE UNIT CAN DISPLAY RESULTS AS VOLTAGE OR AS SHEET RESISTANCE MEASUREMENT IN OHMS/SQUARE.

THIS IS AN ELECTRONIC UNIT THAT USES A FOUR POINT PROBE TO DETERMINE A SEMICONDUCTOR'S CONDUCTIVITY TYPE VIA THE RECTIFICATION METHOD. AN AC VOLTAGE IS APPLIED BETWEEN PROBES 1 AND 3 AND THE RESULTING POTEBTIAL BETWEEN NEEDLES 2 AND 4. THE VOLTAGE DROP V42 IS SMALL WHEN THE AC VOLTAGE AT PROBE 2 IS POSITIVE BECAUSE THE METAL SEMICONDUCTOR JUNCTION IS FORWARD BIASED. BUT FOR NEGATIVE VOLTAGE AT PROBE 2, THE JUNCTION IS REVERSE BIASED. BUT FOR NEGATIVE VOLTAGE AT PROBE 2, THE JUNCTION IS REVERSE BIASED; V IS LARGE AND POSITIVE. THE LARGE POSITIVE AND SMALL NEGATIVE AC V RESULT IN DC COMPONENT WITH THE POLARITY OF THE SEMICONDUCTOR METAL JUNCTION VOLTAGE NECESSARY TO REVERSE BIAS THE JUNCTION. FOR N-TYPE V IS GREATER THAN O, AND FOR P-TYPE V IS LESS THAN O.

THIS UNIT IS A COMBINED CONSTANT CURRENT SOURCE AND DIGITAL VOLTMETER. THE USER CAN INPUT THE DESIRED LEVEL OF CONSTANT CURRENT OR CHOOSE A SIMPLE AUTO RANGING FUNCTION. USED IN CONJUNCTION WITH A FOUR POINT PROBE THE READINGS CAN BE USED TO DETERMINE THE RESISTIVITY OF SEMICONDUCTOR SAMPLES. TYPICALLY USED IN RESEARCH APPLICATIONS, THE UNIT CAN BE OPERATED AS A STAND ALONE UNIT, OR BY USING THE SUPPLIED SOFTWARE CAN BE OPERATED BY A PC. THE UNIT CAN DISPLAY RESULTS AS VOLTAGE, OR AS A SHEET RESISTANCE MEASUREMENT IN OHMS PER SQUARE .

APPARATUS FOR MEASURING OR CHECKING THE ELECTRICAL QUANTITIES OF SEMICONDUCTOR DEVICES (SOLAR MODULES OF 85414090). THIS MACHINE INSPECTS THE FINISHED SOLAR MODULE TO CONFIRM ITS OUTPUT POWER BY MEANS OF STROBE LIGHTING WHICH REPLACES SUNLIGHT.