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THE PRODUCT IS A 32-POSITION TURRET PLATFORM FOR INTEGRATED CIRCUIT (IC.) THE PRODUCT IS DESIGNED SPECICALLY FOR TESTING AND OPTICAL INSPECTION. THE INTEGRATION PROCESS ENABLES THE EQUIPMENT TO PERFORM EXTENDED AUTONOMOUS OPERATIONS. THE TURRET HANDLER IS ABLE TO PERFORM EXTENSIVE OPTICAL INSPECTIONS BUT DOES NOT PERFORM ELECTRICAL TESTING WITHOUT THE CONNECTION TO AN EXTERNAL DEVICE. THE SYSTEM STARTS OPERATION WITH THE INPUT OF EITHER 30 THIN JEDEC OR 20 THICK JEDEC TRAYS OF UNTESTED INTEGRATED CIRCUITS WHICH ARE LOADED INTO THE TESTING SEQUENCE AUTOMATICALLY BY THE FRONT-LOADING HANDLER MODULE. FOLLOWING A PASS STATUS OF THE MARKING INSPECTION SEQUENCE ALL PARTS ARE THEN ABLE TO PROCEED TO THE 2D INSPECTION WHICH CONDUCTS MEASUREMENT CHECKS ON PAD PITCH, WIDTH, LENGTH, GRID POSITION, OFFSET, AND BRIDGE AS WELL AS A 2D BODY MEASUREMENT INSPECTION OF PART BODY WIDTH AND LENGTH. DIMENSIONS SIZE VARIES 2 X 2 TO 12 X 12MM. WITH THE USE OF HIGH-RESOLUTION INTEGRATED COLOUR CAMERAS WITH AN OPTIMIZED LIGHTING SYSTEM WHICH CAN IDENTIFY APPEARANCE DEFECTS OF THE PRODUCT INCLUDING OVERFLOW OR DAMAGE TO THE SUBSTRATE, CHIPS, VOIDS, BLISTERED SURFACES, SCRATCHES, CRACKS, AND THE PRESENCE OF FOREIGN MATERIAL. THE OPTICAL MODULE'S CAMERA SYSTEM INCLUDES GIGE CAMERAS FROM VGA (640 X 480 PIXEL) UP TO 5MP (2448 X 2046 PIXEL). THE ELECTRICAL PERFORMANCE TEST STATION IS RESERVED AND CAN SUPPORT A SPECIFICALLY BUILT-IN COMMUNICATION PROTOCOL. IT CAN BE DIRECTLY CONNECTED TO EXTERNAL TEST EQUIPMENT SUCH AS A NETWORK ANALYZER TO CARRY OUT ELECTRICAL PERFORMANCE TESTING; THE INDICATORS INCLUDE RADIO FREQUENCY PERFORMANCE, THROUGHOUT ALL OF THE TESTING PROCESSES.
MACHINES AND APPARATUS SOLELY OF A KIND USED FOR THE ASSEMBLY AND HANDLING OF SEMICONDUCTOR DEVICES (SOLAR MODULES OF 85414090), NAMELY TABBING MACHINE AND REFLOW FURNACE. A GLASS SHEET IS PICKED FROM A STACK AND POSITIONED ONTO A CONVEYOR WAITING A DEPOSIT OF CELL STRINGS. A BOX OF SOLAR CELLS IS LOCATED INTO THE TABBING MACHINE. THE CELLS ARE AUTOMATICALLY PICKED ONE BY ONE FROM THE BOX, TESTED BY INFRA RED CAMERA AND IF THE CELL IS DEFECTIVE IT IS REJECTED. THE GOOD CELLS ARE SOLDERED TOGETHER INTO A STRING BY MEANS OF A TABBING WIRE (INTERCONECTING WIRE) IN THE REFLOW FURNACE. THE STRINGS ARE PICKED UP AND PLACED ONTO THE GLASS SHEET. THE FINAL LAYOUT WILL BE, FOR EXAMPLE 6 STRINGS WIDE X 8 CELLS LONG.
MACHINES AND APPARATUS SOLELY OF A KIND USED FOR THE ASSEMBLY AND HANDLING OF SEMICONDUCTOR DEVICES (SOLAR MODULES OF 85414090), NAMELY TABBING MACHINE AND REFLOW FURNACE. A GLASS SHEET IS PICKED FROM A STACK AND POSITIONED ONTO A CONVEYOR WAITING A DEPOSIT OF CELL STRINGS. A BOX OF SOLAR CELLS IS LOCATED INTO THE TABBING MACHINE. THE CELLS ARE AUTOMATICALLY PICKED ONE BY ONE FROM THE BOX, TESTED BY THE INFRA RED CAMERA AND IF THE CELL IS DEFECTIVE IT IS REJECTED. THE GOODS CELLS ARE SOLDERED TOGETHER INTO A STRING BY MEANS OF TABBING WIRE (INTERCONNECTING WIRE) IN THE REFLOW FURNACE. THE STRINGS ARE PICKED UP AND PLACED ONTO THE GLASS SHEET. THE FINAL LAYOUT WILL BE, FOR EXAMPLE 6 STRINGS WIDE X 8 CELLS LONG.
MACHINES AND APPARATUS SOLELY OF A KIND USED FOR THE ASSEMBLY AND HANDLING OF SEMICONDUCTOR DEVICES (SOLAR MODULES OF 85414090), NAMELY MARUBENI INSPECTION MACHINE. THE INSPECTION MACHINE, USING INTEGRATED DIGITAL CAMERA IN A DARKENED ENCLOSURE , INSPECTS THE ASSEMBLED MODULES FOR PHYSICAL DEFECTS. THEREAFTER, IN THE SAME MACHIINE, THE SOLAR MODULES ARE THEN VISUALLY CHECKED BY AN OPERATOR WITH THE ASSISTANCE OF A SERIES OF FLUORESCENT BACK LIGHTS.
A MACHINE WHICH BY MEANS OF VACUUM CUPS LIFTS SOLAR SEMICONDUCTOR DEVICES, OFF A GLASS LAYER, THEN THE CELLS ARE INSPECTED BY MEANS OF A FLUORESCENT BACK LIGHT FOR CRACKS, CHIPS OR OTHER DEFECTS. THEN A SHEET OF EVA (ETHYL VINYL ACETATE), IS LOCATED ONTO THE GLASS SHEET, THE MODULE IS THEN LOWERED ONTO THE GLASS/EVA. A FURTHER SHEET OF EVA IS MOUNTED ONTO THE DEVICES, AND A BACKING SHEET IS MOUNTED ONTO THE EVA FILM.