Test equipment specially designed for testing finished or unfinished semiconductor devices as follows and specially designed components and accessories therefor:
For testing S-parameters of items specified in 3.A.1.b.3.;
3B002.b
Not used since 2004
3B002.c
For testing items specified in 3.A.1.b.2.
Product Examples
Keysight N5247B vector network analyzer for RF testing
Cascade Microtech Summit 12000 wafer probing system
Advantest V93000 integrated circuit tester
MPI TS2000-SE semi-automatic probe station
Wentworth Labs Pegasus semiconductor wafer prober
Decontrol note
Les équipements de test généralistes non spécifiquement conçus pour les dispositifs avancés ou pour des applications de recherche fondamentale peuvent être exclus du contrôle.
The export of 'technology' which is 'required' for the 'development', 'production' or 'use' of items controlled in Categories 0 to 9 is controlled according to the provisions in each Category. 'Techno...
General Software Note (GSN)
The Lists do not control 'software' which is either: 1. Generally available to the public by being: a. Sold from stock at retail selling points, without restriction, by means of: (1) Over-the-counter ...
Category 3 - Electronics
This category covers electronic components (including semiconductors), integrated circuits, electronic assemblies and related equipment. Controls focus on performance thresholds such as operating freq...
Catch-All Clause - Article 4 of Regulation (EU) 2021/821
Article 4(1): An authorisation shall be required for the export of dual-use items not listed in Annex I if the exporter has been informed by the competent authority that the items in question are or m...
Cyber-Surveillance Catch-All - Article 5 of Regulation (EU) 2021/821
Article 5(1): An authorisation shall be required for the export of cyber-surveillance items not listed in Annex I if the exporter has been informed by the competent authority that the items in questio...