A B-SCOPE TRANSLATING MULITIPHOTON IMAGING MICROSCOPE. IT IS USED FOR DEEP IMAGING IN LIVING SPECIMENS. IT SCANS A LASER BEAM OVER A SAMPLE TO EXCITE A FLUROPHORE WHICH IN TURN, EMITS A SECONDARY WAVELENGTH, OF LIGHT, WHICH IS CAPTURED BY THE PMT/CAMERA. THE DATA FROM THE CAMERA IS ANALYSED THROUGH A PC AND A VISUAL IMAGE IS FORMED. MULTIPHOTON MICROSCOPY IS AN IMAGING TECHNIQUE THAT USES 2 OR 3 PHOTON EXCITATION FOR FLUROPHORES IN A SPECIMEN SPECIFICATIONS: EXCITATION OBJECTIVE PUPIL DIAMETER 20 MM (MAX) FIELD OF VIEW 16 MM DIAGONAL SQUARE (MAX) AT THE INTERMEDIATE IMAGE PLANE SCANNERS 8 KHZ RESONANT (X) GALVANOMETRIC SCAN MIRROR (Y) SCAN MODES SQUARE, RECTANGLE, AND LINE SCAN ZOOM 1X - 16X (CONTINUOUSLY VARIABLE) SCAN RESOLUTION UP TO 2048 X 2048 (BI-DIRECTIONAL) UP TO 4096 X 4096 (UNIDIRECTIONAL) PRIMARY DICHROIC MIRROR 670 - 1100 NM SHORTPASS DETECTION TWO ULTRASENSITIVE GAASP PMTS POSITIONED DIRECTLY BEHIND THE OBJECTIVE WAVELENGTH RANGE 300 - 720 NM FILTER CUBE SINGLE CUBE (USER CHANGEABLE) INCLUDED FILTERS DICHROIC: 562 NM LONGPASS EMISSION: 525 NM, 50 NM BANDWIDTH AND 607 NM, 70 NM BANDWIDTH REFLECTED VISIBLE WIDE FIELD IMAGING MOTORIZED SWITCHING BETWEEN SCANNING AND WIDE FIELD MODES 565 NM LED ILLUMINATION WITH VARIABLE INTENSITY CONTROL C-MOUNT CAMERA PORT WITH HIGH-SENSITIVITY CCD TRANSLATION FINE XY ±1.0" (±25.4 MM) WITH ROTARY CONTROL KNOBS FINE Z ±0.5" (±12.7 MM) WITH ROTARY CONTROL KNOB COARSE Z ±10" (±254 MM) WITH ROTARY CONTROL KNOB ROTATION ±50° AROUND OBJECTIVE FOCUS THE IMAGES ARE VIEWED ON A PC (NOT INCLUDED IN THE CLASSIFICATION)

CLASSIFICATION HAS BEEN DETERMINED IN ACCORDANCE WITH THE FOLLOWING:- GENERAL INTERPRETATIVE RULES (GIR)S GIR 1 HAS BEEN USED TO CLASSIFY THIS PRODUCT BY THE TERMS OF HEADING 9011 COMPOUND OPTICAL MICROSCOPES, INCLUDING THOSE FOR PHOTOMICROGRAPHY, CINEPHOTOMICROGRAPHY OR MICROPROJECTION GIR 6 HAS BEEN USED TO CLASSIFY THE GOODS TO SUBHEADING LEVEL 901120 OTHER MICROSCOPES, FOR PHOTOMICROGRAPHY, CINEPHOTOMICROGRAPHY OR MICROPROJECTION TARIC CODE 9011209000 OTHER THAN PHOTOMICROGRAPHIC MICROSCOPES FITTED WITH EQUIPMENT SPECIFICALLY DESIGNED FOR THE HANDLING AND TRANSPORT OF SEMICONDUCTOR WAFERS OR RETICLES ALSO CLASSIFIED IN ACCORDANCE WITH HSENS 9011 (A)