WAFERS\PROBES OF CUSTOM FABRICATED CONTACT\NON CONTACT MODE SILICON FOR USE IN SCANNING PROBES MICROSCOPES (SPMS).THE PROBE SCANS A SPECIMEN AND FORMS AN IMAGE ON A SURFACE. IT CREATES THE SCAN UNDER VERY HIGH RESOLUTION USING THE MICROSCOPE.

GIR'S 1 AND 6. TEXT TO HEADING 9012.