SCANNING PROBE MICROSOPES (SPM) ARE A TYPE OF MICROSCOPE SYSTEM THAT GENERATES IMAGES OF SURFACES OF MATERIALS USING A PHYSICAL PROBE THAT SCANS THE GIVEN MATERIAL/SAMPLE. THEY ARE USED FOR EXAMINING THE MICROSCOPIC STRUCTURE OF MATERIALS IN ORDER TO PROVIDE TOPOGRAPHICAL/SURFACE SCANS. THEY DO NOT MEASURE, DETERMINE, OR TEST FOR THE MECHANICAL PROPERTIES OF MATERIALS. THEY ARE NOT COMPOUND OPTICAL MICROSCOPES.

GENERAL RULES 1 AND 6 FOR THE INTERPRETATION OF THE COMBINED NOMENCLATURE. THE TEXT TO TARIC CODES 9012, 9012 10, 9012 10 90 AND 9012 10 90 00. THE HARMONISED SYSTEM EXPLANATORY NOTES TO 9011 AND 9012.