WAFERS\PROBES OF CUSTOM FABRICATED CONTACT\NON CONTACT MODE SILICON FOR USE IN SCANNING PROBES MICROSCOPES (SPMS). THE PROBE SCANS A SPECIMEN AND FORMS AN IMAGE ON A SURFACE. IT CREATES THE SCAN UNDER VERY HIGH RESOLUTION USING THE MICROSCOPE.

GENERAL RULES 1 AND 6 FOR THE INTERPRETATION OF THE COMBINED NOMENCLATURE. THE TEXT TO TARIC CODES 9012, 9012 90, 9012 90 90 AND 9012 90 90 00. THE HARMONISED SYSTEM EXPLANATORY NOTES TO HEADING 9012.